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The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects / by Lawrence Joseph Sykes.
By: Sykes, Lawrence Joseph,
Publication info: 1981.
Contributed by: University of Florida, George A. Smathers Libraries (archive.org)
Subjects: Crystals Defects Dissertations, Academic Electron microscopy Materials Science and Engineering Materials Science and Engineering thesis Ph. D Transmission electron microscopes UF