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  1. The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects / by Lawrence Joseph Sykes.
    By: Sykes, Lawrence Joseph,
    Publication info: 1981.
    Contributed by: University of Florida, George A. Smathers Libraries
    Subjects: Crystals  Defects  Dissertations, Academic  Electron microscopy  Materials Science and Engineering  Materials Science and Engineering thesis Ph. D  Transmission electron microscopes  UF  
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