316 



SUBJECT INDEX 



Code for identification of instruments, 



6 

 Collectors for space potential, 223-225 

 Conductivity of dielectrics, change 



with frequency, 150 

 Contact square for thickness measure- 

 ments, 9-10 

 Crystal counters, 300-302 

 lifetime, 301 

 materials for, 302 

 resolving time, 301 

 Current flow pattern, 8 

 Cutoff wavelength, 234-237, 264 



Dark current, 238-244, 250-254, 302, 

 303 

 in crystal counters, 302 

 in gas-filled photoelectric cells, 244 

 in photoemissive systems, 238-240 

 in photomultipliers, 250-254 

 in radiation-induced photo- 

 conductors, 303 

 separation from photocurrent, 239 

 in vacuum photoelectric cells, 242 

 Dead time in Geiger counters, 293 

 Dewcel, 143 



Dielectric radiation bolometers, 279 

 Dielectric humidity transducer, 



141-143, 146-150 

 Differential capacitor, 67 

 Differential transformer, 46, 48-51 

 Differentiating systems for velocity 



measurements, 91 

 Displacement transducers, 23-90 

 bolometers, 72-74 

 capacitive, 66-72 

 applications, 72 

 change-of-area system, 69-70 

 change-of-distance system, 66-69 

 differential capacitor, 67-70 

 force requirements, 71 

 rotary motion, 70 

 serrated type, 70 

 carbon disk, 38-39 

 electrolytic, 42-44 

 electronic, 85 

 induction systems, 62-66 

 reluctance variation, 65 



Displacement transducers, inductive 

 systems, 44-66 

 differential, 46 

 eddy current, 52-56 

 magneto-elastic, 56-60 

 ratio output, 46 

 reluctance variation, 44-47 

 synchros, 60-62 



variable differential transformer, 

 48-51 

 ionization transducer, 86-89 

 mechanic -optical system, 89 

 mechano-electric systems, 85 

 moving-anode, 85 

 piezoelectric (see Piezoelectric dis- 

 placement transducers) 

 potentiometers (see Potentiometers 

 for displacement measurements) 

 resistive, 24-44 



strain gauges (see Strain gauges) 

 semiconducting, 37-42 

 slide-wire resistors, 24-30 

 spring transducer, 30 

 thermal systems, 72-74 

 vibrating-string system, 83 

 Distance gauges (see Thickness 

 gauges) 



Eddy-current transducer, for displace- 

 ment measurements, 52-56 

 for thickness measurements, 11, 

 13-14 

 Electric field strength transducers, 

 229-232 

 electron-beam probe, 230-231 

 space-potential systems, 230 

 in strong rf fields, 231-232 



glow-discharge method, 231-232 

 thermal method, 232 

 Electric force lines, method of 



plotting, 226 

 Electrical methods, advantages, 1 

 Electrical transducers, 215-232 

 responding, to electric field 

 strength, 229-232 

 to excess charges, 220-221 

 to free charges, 215-221 

 to space charges, 221-223 

 to space potential, 223-226 



