SUBJECT INDEX 



321 



Photodiode, 272-274 

 Photoelectric cells, 233-261 

 gas-filled, 243-245 



response time, 245 

 photomultipliers, 245-261 



(See also Photomultipliers) 

 vacuum, 240-243 

 Photoemission, 233-235 

 Photoemissive cathodes, 235-237 

 Photomultipliers, 245-261 

 amplification, 246 

 circuits, 255-261 



comparison with photoelectric all- 

 plus amplifier, 254 

 dark current, 250-254 

 fatigue effects, 248 

 gain control, 246-247, 256-259 

 influence on, of stray fields, 254-255 



of temperature, 251-255 

 with logarithmic characteristic, 



259-261 

 noise, 252-254 

 operation, 255 

 response time, 249 

 spectral distribution of sensitivity, 



247 

 thermionic emission, 251-252 

 time dispersion in, 249 

 voltage dividers for, 256-259 

 Phototransistor, 274 

 Photovoltaic cells, 269-274 



spectral distribution of sensitivity, 



271 

 threshold wavelength, 271 

 Piezoelectric-displacement trans- 

 ducers, 74-83 

 bimorph benders, 77 

 bimorph twisters, 78 

 frequency response, 82 

 materials for, 79-80 



piezoelectric constants of, table, 

 75 

 modes of operation, 76 

 Piezoelectric effect, 74-76 

 Piezoelectric pressure transducers, 



105-106 

 Plateau in Geiger counters, 292-293, 



295 

 Point counters, 297-298 

 "Point dwell meter," 93 



Polarization effect in crystal counters, 



301 

 Position convectron, 73 

 Potential probes, 223-225 

 Potentiometers for displacement 

 measurements, 25-30 



helical, 25 



moment of inertia, 29 



noise in, 29 



nonlinear, 26-28 



sine and cosine, 27-28 



torque, 28 

 Pressure transducers, 101-117 



Bridgman type, 102-104 



capacitive, 104—105 



electrokinetic, 106-108 



gas-discharge system, 108-109 



for intracardial measurements, 51 



ionization gauges, 112-117 



Philips-Penning type, 116 



piezoelectric, 105 



resistive, 102-104 



pressure coefficient of materials, 

 table, 103 



thermal gauges, 109-112 

 Probes, for space charges, 221-223 



for space potential, 223-225 

 Proportional counters, 290 



Quantum yield, in photocounters, 

 261-262 

 in photoemission, 234-235 

 Quartz, piezoelectric effects, 79 



Radiant sensitivity, photoemission 



systems, 235 

 Radiation bolometers, 278-280 



comparison, 280 



dielectric, 279 



superconducting, 279-280 

 Radiation gauges for thickness 

 measurements, 17-23 



absorption, 18 



alpha, 22-23 



backscatter, 18 



beta, 21-22 



gamma and X-ray, 19-21 

 Radiation-induced photoconduc- 

 tivity, 302-303 



