SPECIAL METHODS 



the outside view of it. A is a connecting ring 

 for setting this device on to the specimen 

 shifting mechanism of ordinary type elec- 

 tron microscope. B shows a ring-shaped 

 insulator of porcelain. C, D and E are the 

 outside walls of the furnace, which are made 

 of porcelain. F is a heater of Mo-wire. G is 

 an inside wall of the furnace, made of Mo- 

 sheet. The specimen cartridge, composed of 

 Mo and Porcelain I, can be put into and 

 taken out of the furnace, which is heated 

 beforehand, through another chamber for 

 pre-evacuation. L is used as a guide plate, 

 when the cartridge is inserted in the furnace. 

 The temperature of the specimen is measured 

 by Pt-Pt,Rh thermocouple mounted to G. 

 To av^oid charging due to electron irradia- 

 tion, the outer surface of the porcelain is 

 covered with evaporated carbon. The pole 

 piece of the objective lens is so well pro- 

 tector that it cannot be damaged by heat- 

 ing. 



Reflection type of the specimen heating 

 device is also made according to the same 

 design with the only exception that it is 

 equipped with a mechanism by which the 

 glancing angle of the specimen is arbitrarily 

 changeable. 



A battery is employed as power source 

 and the specimen temperature reached up to 

 1,000°C at about 14 V, 8 amp. The drift of 

 the specimen due to thermal expansion from 

 room temperature to 1 ,000°C was about 0.2 

 mm. This drift can be easily controlled, as 

 the specimen-shifting mechanism is the same 

 as that of ordinary electron microscope. The 

 difference between the temperature of the 

 specimen and that indicated by a meter was 

 about 50°C at about 600°C, from the test 

 of melting point of Al film. 



The resolution obtained with this device 

 in operation was determined by measuring 

 the distances of two evaporated particles of 

 Pt-Pd. Fig. 17 shows two serial micrographs 

 taken with the specimen heated at 300°C. 



o 



The resolving power is better than 30 A. 



This proved that such a high resolution is 

 also obtainable at high temperature. 



Application of Specinieii-IIeatiiig De- 

 vice. One example of its application is 

 shown. Evaporated thin films of Al-Cu (SO- 

 SO) alloy have been used as the specimen 



Fig. 15. Construction of new specimen heating 

 device, transmission type. 



'•r>ni''r<m^mmmsmmimr-^-^ - •..*^ ,- j«ai»s 



Fig. 16. Out-side view of specimen heating device. 



Fig. 17. Evaporated particles of Pt-Pd, heated 

 at 300°C. 



267 



