TRANSMISSION ELECTKO.N AIICKOSCOPY OF METALS 



by Pitsch (57). Pitsch suggested a trans- 

 formation mechanism for thin foils and gave 

 evidence for the mechanism in bulk material 

 by a combination of transmission microscopy 

 and diffraction. 



Thin metal films and their properties have 

 been studied for the case of condensed layers 

 by Takahashi and INIihama (58) for an Al-Cu 

 alloy. The recrystallization was followed, 

 while the object was heated on a hot stage 

 inside the microscope. Twins in condensed 

 layers of silver, gold, copper and nickel (59) 

 as well as electrodeposited nickel (60) have 

 been investigated by Ogawa et at. Reimer 

 made similar observations on electrode- 

 posited metals (61) and condensed silver 

 (62). Studies on the formation of condensed 

 layers (63) and the mechanical properties 

 such as crack propagation within films are 

 reviewed by BassettandPashley (64). Beaten 

 gold (65) and precipitated gold flakes have 

 been studied by Briiche et al. (66). Brame 

 and Evans (67) studied the deformation of 

 thin films on solid substrates. 



Studies on different alloys are summarized 

 by Saulnier and Mirand (68). Observations 

 on semi-conductor material as germanium. 



**p. 









V<:j-r'- ^•>'1--JC 



"/■ ■; 



y'. 





=1;- ' 





Fig. 27. Loops due to condensed vacancies in 

 neutron irradiated copper. (Silcox (in 27) Courtesy 

 Institute of Metals) 



Fig. 28. CuAu II in the stage of formation. 

 {Pashley and Presland,^^ Courtesy Institute of 

 Metals) 



silicon (69, 70) and bismuth telluride (19) 

 have been made by Geach, Phillips and 

 Indng. 



Surface together with the underlying 

 structure have been investigated for the 

 case of deformation by Thomas and Hale 

 (39) and for studying an etching structure 

 of aluminum by Phillips and Welsh (71). 

 This kind of research is possible by electro- 

 polishing only one side of the specimen, 

 while the other is protected by a varnish. 



These few examples mRv show that trans- 

 mission electron microscopy is a powerful 

 means for the study of defects and precipi- 

 tates in crystalline sohds, the knowledge of 

 these defects being of great importance for 

 the understanding of the physical behavior 

 of crystallized matter. 



REFERENCES 



1. Heidenreich, R. D., J. Appl. Phys., 20, 993 



(1949). 



2. Castaing, R., "Proceedings the Third 



International Conference on Electron 

 Microscopy" (London 1954) p. 379. 



3. SuiTo, E. AND Uyeda, N., Proc. of the Japan 



Academy, 29, 324-330 (1953). 



4. Hashimoto, H., /. Phys. Soc. Japan, 9, 150- 



161-(1954). 



305 



