REFRACTION OF LIGHT, REFRACTOMETRY AND INTERFEROMETRY 



ferential llefractometer," J. Appl. Phys., 

 17(5), 392-398 (1946). 



74. Kegeles, G., and Gutter, F., "Determina- 



tion of the Sedimentation Constants from 

 Fresnel Diffraction Pattern.s," J.A.C.S., 

 69, 1302-1305 (1947); 73, 3770-3777 (1951). 



75. L.-VMM, O., "Measurements of Concentration 



Gradients in Sedimentation and Diffusion 

 by Refraction Methods. Solubility Proper- 

 ties of Potato Starch," Novo Acta Regiae 

 Soc. Sci. Upsaliensis, IV,10(6), 1-115 (1937). 



76. Grauer, B., "Prismatic Refractometer," 



Nat'l. Bur. Std. Tech. News Bull., 37(9), 

 535 (5953). 



77. TiLTON, L. W., AND Taylor, J. K., "Refrac- 



tive Index Measurements," in: Berl, W. 

 C, "Physical Methods in Chemical Anal- 

 ysis," Vol. 1, Academic Press, N. Y., 1950. 



78. Lauer, J. L., and King, R. W., "Refractive 



Index of Liquids at Elevated Tempera- 

 tures," Anal. Chem., 28(11), 1697-1701 

 (1956). 



79. RoTHEN, A., "Optical Properties of Surface 



Films," Ann. N.Y. Acad. Sci., 153, 1054- 

 1064 (1951). 



80. Dayhoff, E. S., "Correction in High Ac- 



curacy Fresnel Region Microwave Inter- 

 ferometry," N. B. S. Tech. Rep. 4514 (Feb., 

 1956). 



81. Raveau, C, "Etude des Franges des Lames 



Crystallines au Moyen de la Surface des 

 Indices," Bull. Soc. Fr. de Mineral., 34, 

 6-12 (1911); "Sur la Visibilite et les Singu- 

 laritds des Franges d'interference," Resum. 

 Comm. Soc. Fr. de Phys., p. 40, (April, 1901). 



82. LowRY, T. M., AND Allsopp, C. B., "A Pho- 



tographic Method of Measuring Refractive 

 Indices," Proc. Roy. Soc. London, A-126, 

 165 (1929). 



83. Lord Rayleigh, "On Some Physical Prop- 



erties of Argon and Helium," Proc. Roy. 

 Soc. London, 59, 200-217 (1896). 



84. Williams, W. E., "Studies in Interferome- 



try," Proc. Phys. Soc, 45, 699-727 (1933). 

 "Applications of Interferometry" Methuen, 

 London (1928). 



85. HiRSH, P., "The Refractometer and the In- 



terferometer," Z. Nahr. Genuscm., 43, 65- 

 78 (1922); "Die Abderhalden-Reaktion 

 Mittels der Quantitative!! Interferome- 

 trischen Methods," Deutsch. Klin. Wchn- 

 schr., 4, (1365-1366 (1925); Deutsch. Klin. 

 Wchnschr., 4, 1560-1562 (1925). 



86. Cotton, A., "L'lnterf^rometre de Jamin a 



Faisceaux Polarises," Rev. d'Opt. Theor. et 

 Instrum., 5, 153-166 (1934). 



87. Brillouin, M., "Recherches sur I'ellipti- 



citd du G^oide," C. R. Acad. Sci., 137, 786- 

 788 (1903); "M^moires des Savants Stran- 

 gers," 23(3) (1908). 



88. Barchewitz, P., "Etude sur I'interf^rome- 



tre a rayous Polarises de Jamin," Rev. d'- 

 Opt. Theor. et Instrum., 5, 167-178 (1934). 



89. Smith, F. H., U. S. Pat. 2,601,175, June 17, 



1952. 



90. Sagnac, G., Le Radium (July 8, 1911). 



91. Ramsay, B. P., "A grating interferometer" 



/. Opt. Soc. Am., 24, 253-268 (1934). 



92. Barus, C, "Elliptic Interferences," Carnegie 



Inst. Wash. Publ. No. 149: (1911-1914). 



93. Marton, L., "Electron Interferometer," 



Phys. Rev., 85(4), 1057-1058 (1952). 



94. Marton, L., Simpson, J. A., and Suddeth, 



J. A., "An Electron Interferometer," Rev. 

 Scientific Instr., 25 (10), 1099-1104 (1954). 



95. Simpson, J. A., "Electron Interference Ex- 



periments," Rev. Modern Phys., 28(3), 254- 

 260 (1956). 



96. Marton, L., "Electron Physics," Nat. Bur. 



Std. Circ. 527. 



97. Jonnard, R., "R^fractometrie Interf^ren- 



tielle et Structure du S^rum Sanguin," 

 Maloine, Paris, 1937. 



98. Jonnard, R., "R^fractometre Interferen- 



tial Pour Usages Biologiques," Rev. d'Opt. 

 Theor. ei Instrum., 15, 425-430 (1936). 



99. DuFFiEux, N., "Fente Simple Pour Spectro- 



graphies," Rev. d'Opt. Theor. et Instrum., 

 15, 298 (1936). 



100. Lendel, E., Zimmer, A., and Fehlow, W., 



Munch. Med. Wchnschr., 37, 1-16 (1927). 



101. Bruins, H. R., Rec. des Trav. Chim., 50, 121- 



128 (1931); Koll. Zeitschr., 54, 265-271 

 (1931); 54, 272-275 (1931); 57, 152 (1932); 

 59, 263 (1932). 



102. Jonnard, R., "Automatic Electronic Record- 



ing Interferometer. Il-Performance," O. 

 N. R. Technical Report, March, 1957. 



103. Ollivier, H., "Cours de Physique Gen6- 



rale," 3, 252, Hermann, Paris, 1923. 



104. Jonnard, R., "The Orthoptic Microscope 



Interferometer. Theory, Standardization, 

 Applications to Precision Interferential 

 Refractometry." Proc. 7th Nat. Conf. 

 I.S.A., Sept. 8-12, Cleveland, O., 1952. 



105. Jonnard, R., U. S. Patent 2,858,728, Nov. 4, 



(1958). 



106. Stockbarger, D. C, and Bitrns, L., "Line 



Shape as a Function of the Mode of Spectro- 

 graph Slit Irradiation," J. Opt. Soc. A7n., 

 23, 379 (1933). 



107. Jonnard, R., "Random Selection System for 



500 



