REFRACTION OF LIGHT, REFRACTOMETRY AND INTERFEROMETRY 



method, and by Schneider (234), using a 

 mica plate interferometer. Many contem- 

 porary apphcations are, of course, concerned 

 with semiconductor surfaces. Multiple re- 

 flection interferometers incorporating such 

 surfaces lend themselves to a great diversity 

 of measurements (reflectivity, conductivity, 

 flatness, thickness, etc.) as shown by Belk, 

 Tolansky and Turnbull (235). Germanium 

 has been extensively studied by such optical 

 methods (Rank, Bennett, and Cronemeyer: 

 235), and so was tellurium (Hartig and Lo- 

 ferski : 237) . Limitations of the methods were 

 evaluated by Berning (238), and by Smith 

 (239). 



An unexpected application of interferom- 

 etry is the analysis of flames by interferom- 

 etrj^ (Harned and Ginsburg: 240). 



Detailed calculations and actual measure- 

 ment techniques with the various types of 

 interferometers — including the Fabry-Perot 

 etalon, the "echelon" type, and several com- 

 mercial comparators — are found in Candler's 

 book (241). Apphcations to the control of 

 grating ruling engines are striking. The use 

 of two Fabry-Perot etalons in tandam is 

 shown to permit the measurement of the re- 

 fractive index of an interposed gas. By con- 

 trast, rather more detailed theoretical de- 

 velopments relative to the same topics are 

 found in Tolansky 's book (242), in that of 

 Ditchburn (243) and a paper by Jones (244) . 



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