DIFFKACTIO.N MICROSCOPY 



9. Oosterkamp, W. J., Philips Research Repts., 

 3, 49, 161, 303 (1948). 



10. MiJLLER, A., Proc. Roy. Soc. London, A132, 



646 (1931). 



11. Henke, B. L., Lundberg, B.-, anu Engstrom, 



A., "X-ray Microscopy and Microradiog- 

 raphy, Cosslett, V. E., Engstrom, A. and 

 Pattee, H. H., eds.. Academic Press, New 

 York, 1957, p. 240. 



12. P'or absorption theory and (hita see Compton, 



A. H., and Allison, S. K., "X-rays in Theory 

 and Experiment," 2nd ed., Van Nostrand, 

 New York, 1935, Chapt. VII, Sees. 7 and 8. 



13. For application of this method see Henke, 



B. L., in "X-ray Microscopy and Micro- 

 radiography," Cosslett, et al., eds.. Aca- 

 demic Press, New York, 1957, p. 76. 



14. For curves of reflected x-ray intensity vs. 



angle of incidence see Rieser, L. ]\I., ./. Opt. 

 Soc. Am., 47, 987 (1957), and Hendrick, R. 

 W., /. Opt. Soc. Am., 47, 165 (1957). 



15. For application of this method see Ref. 13 



above, p. 82. 



16. Pattee, H. H., Science, 128, 977 (1958). 



17. Pattee, H. H., in "X-ray Microscopy and X- 



ray Microanalysis," Cosslett, V. E., Eng- 

 strom, A., and Pattee, H. H., eds., Elsevier, 

 Amsterdam, 1960, p. 79. 



18. DuNCUMB, P., ibid., p. 374, 617. 



19. Rosengren", B. II. O., Acta Radiol. Supple- 



ment 178, Stockholm, 1959. 



20. Pattee, H. H., in "X-ray Microscopy and 



X-ray Microanalysis," Cosslett et al., eds., 

 Elsevier, Amsterdam, 1960, p. 56. 



21. See Ehrenberg, W., and White, jNI., in "X- 



ray Microscopy and Microradiography," 

 Cosslett et al., eds., Academic Press, New 

 York, 1957, p. 214. 



22. Eastman Kodak Company Research Labora- 



tories, Rochester, New York has made ex- 

 perimental emulsions for microradiography' 

 similar to Type 649, but none is yet com- 

 mercially available. 



23. Recourt, a., in "X-ray Microscopy and Mi- 



croradiography, Cosslett et al., eds., Aca- 

 demic Press, New York, 1957, p. 234. 



24. Feldman, C, and O'Hara, M., /. Opt. Soc. 



Am., 47, 300 (1957). 



25. Evaporated fluorescent screens have been ob- 



tained by the author from the Liberty Mir- 

 ror Division of Libby-0 wens-Ford Glass 

 Company, Brackenridge, Pennsylvania. 



26. See, for example, Seitz, F., Rev. Mod. Phys., 



18, 384 (1946). 



27. Ladd, W. a., Hess, W. M., and Ladd, M. W., 



Science, 123, 3192 (1956). 



28. See discussion by Pattee in "X-ray Micros- 



copy and Microradiography," Cosslett et 

 al., eds., Academic Press, New York, 1957, 

 p. 387. 



29. Chalkley,L.,/. Opt. Soc. Am., 42, 387 (1952). 



30. Experimental samples of this material were 



obtained through the cooperation of Dr. E. 

 Ryskiewicz of the International Business 

 Machines Research Laboratory, San Jose, 

 California. 



31. Pattee, H. H., in "X-ray Microscopy and 



X-ray Microanalysis," Cosslett et al., eds., 

 Elsevier, Amsterdam, 1960, p. 61. 



32. AuLD, J. H., AND McNeill, J. F., ibid, p. 5. 



33. AsuNMAA, S. K., Nature 186, 1036 (1960). 



34. Mollenstedt, G., and Huang, L. Y., in 



"X-ray Microscopy and Microradiog- 

 raphy, Cosslett et al., eds.. Academic Press, 

 New" York, 1957, p. 392. 



35. Huang, L. Y., Z. Phys. 149, 225 (1957) 



36. Comb:6e, B., and Recourt, A., Philips Tech. 



Rev., 19, 221 (1957/58). 



37. Ehrenberg, W. and Spear, W. E., Proc. 



Phys. Soc. London, B64, 67 (1951). 



38. Engstrom, A., and Lindstrom, B., Biochim. 



et Biophys. Acta, 4, 351 (1950). 



39. Engstrom, A., Greulich, R. C, Henke, B. 



L., AND Lundberg, B., in "X-ray Micros- 

 copy and Microradiography," Cosslett 

 et al., eds.. Academic Press, New York, 1957, 

 p. 218. 



40. Fitzgerald, P. J., ibid., p. 49. 



41. Ely, R. V., ibid., p. 59. 



42. Salmon, J., ?'6zd., p. 465. 



43. Greulich, R. C, in "X-ray Microscopy and 



X-ray Microanalysis," Cosslett et al., eds., 

 Elsevier, Amsterdam, 1960, p. 273. 



H. H. Pattee 



DIFFRACTION MICROSCOPY* 



A technique for indicating the changes in 

 metal crystals upon deformation was pro- 

 posed in 1945 by Barrett as a kind of micros- 

 copy (1). From many examples applied to 

 single crystals and polycrystalline metals one 

 example is selected. Figure la diagrammati- 

 cally illustrates the techniciue, which consists 

 in directing the x-ray beam at a small graz- 

 ing angle on the surface of the specimen, 

 while the film is arranged above the surface, 

 as shown, so as to register any beams re- 



* Adapted from publications by C. S. Barrett 

 and Y. Cauchois. 



569 



