160 



Index 



Contrast by scattering, 40 



— images, phase, 53 



— in electron microscope images, 



origin of, 40 



— microscope, phase, 55 

 — , phase, 54 



Corrected microscope objectives, 



103 

 Critical illumination, 146 

 Cross section, absorbing, 63 



— section, scattering, 63 



— section, total scattering, 129 

 Curvature, image, 11 

 Cylindrical microscope, 25 



D 



Dark field illumination, 19 

 De Broglie hypothesis of electronic 

 waves, 2 



— wavelength, 17 

 Defect, chromatic, 46 

 Definition of refractive index, 6 

 Desk model, RCA magnetic micro- 

 scope, 75 



Detection limit, 56 



— limit of uncorrected electron mi- 



croscope, 62 

 Diffraction, 56 



— adapter, 137 



— effect, 18 



— error, 132 



— , Fresnel. See Contour phe- 

 nomena. 



— patterns, 138 



— patterns, Fresnel, 50 



— theory of electron microscope, 



142 

 Disc of minimum confusion, 11 

 Disk, Airy, 18 

 Dispersion, chromatic, 5 

 — , relative, 21 

 Distortion, image, 11 

 Driving circuits, stabilization of. 38 



— voltage, fluctuations of, 56, 71 

 Dutch electron microscope, 84 

 Dynamics and optics, Hamiltonian 



analogy between, 2 

 — , principle of least action of, 4 



Edge wave, 50 

 Effect, diffraction, 18 

 — , illuminating beam, 37 

 Elastic scattering by Thomas- 

 Fermi atom, 133 



— scattering of electrons, 41 

 Electric field, lens effect of axially 



symmetrical, 6 

 Electrode, sheath. 111 

 Electro-magnetic waves, 22 

 Electron cloud, 116 



— gun, 34 



— miscroscope, chemical and struc- 



tural analysis by, 137 



— microscope, detection limit of 



uncorrected, 62 



— microscope, diffraction theory 



of, 142 



— microscope, Dutch, 84 



■ — microscope, French, 82 



— microscope, future development 



of, 99 



— microscope images, origin of 



contrast in, 40 



— microscope, improvements in 



uncorrected, 99 



— microscope, Metropolitan Vick- 



ers, 82 



— microscope, preparation of spe- 



cimens for, 74 



— microscope, present limit of, 3 



— microscope, RCA universal, 78 



— microscope, resolution limit of 



uncorrected, 56 



— microscope, Siemens & Halske 



A.G., 81 



— microscopes, commercial, 65 



— microscopes of the transmission 



type, 29 



— microscopes without lenses, 25 



— microscopy, achievements of, 85 



— microscopy, ultimate limit of, 



127 



— optics, geometrical, 2, 4 



— trajectories, 34 



— trajectories in magnetic lens, 8 



— trajectory, 16 



