Index 



163 



Objectives, corrected microscope, 



103 

 — , high-frequency-operated, 103 

 — , space-charge-corrected, 107 

 Objects, externally illuminated, 142 

 — , non-self-luminous, 29 

 — , self-luminous, 29, 142 

 Optical definition of intensity, 13 



— microscope. resolving power 



limit of, 1 

 Optics and dynamics, Hamiltonian 



analogy between, 2 

 — , electron wave, 16 

 — , geometrical electron, 2, 4 

 — , principle of least time of, 4 

 Optimum aperture, 58 



— resolution limit, 59 



Origin of contrast in electron mi- 

 croscope images, 40 



Paraxial image, 10 



— rays, 10 



Patterns, diffraction, 138 

 — , Fresnel diffraction, 50 

 Phase contrast, 54 



— contrast images, 53 



— contrast microscope, 55 

 Phenomena, contour, 49 

 Photography, stereoscopic, 70 

 Photons, 22 



Physical objective aperture. 36 



Point, axial, 10 



Potential, equivalent electrostatic, 



9 

 Power limit of optical microscope, 



resolving, 1 



— of electrostatic lens, 38 

 Preparation of specimens for elec- 

 tron microscope, 74 



Present limit of electron micro- 

 scope, 3 

 Principle of indeterminacy, 104 



— of least action of dynamics, 4 



— of least time of optics, 4 

 Projector lens, 31 



Proton microscope, 124 



R 



Ray of light, 16 

 Kays, paraxial. 10 

 RCA magnetic microscope, desk 

 model, 75 



— magnetic microscope, floor model, 



type B, 65 



— universal electron microscope, 78 

 Reduction of resolution limit, 100 

 Reflecting microscope, 29 

 Refractive index, definition of, 6 

 Relative dispersion, 21 

 Resolution limit of a microscope, 19 



— limit of uncorrected electron 



microscope, 56 



— limit, optimum, 59 



— limit, reduction of, 100 



— power limit of optical microscope, 



1 

 Resolving power, limitations for, 



56 

 Resulting error, 58 . 

 Ripple voltage, 72 



Scalar waves, 147 

 Scanning microscope, 29, 95 

 Scattered electrons, incoherent, 148 

 Scattering by Thomas-Fermi atom, 



elastic, 133 

 — , contrast by, 40 



— cross section, 63 



— cross section, total, 129 



— of electrons, 41 



— of electrons, elastic, 41 



— of electrons, inelastic. 42 



— of light and of electrons, 138 

 Schrodinger wave equation, 17 

 Self-luminous objects, 29, 142 

 Shadow microscopes, 141 

 Shadowcast method, 93 



Sheath electrode. 111 

 Short focus lens, 108 

 Siemens & Halske A.G. electron 



microscope, 81 

 Simple microscopes, 25 

 Solar constant, 15 



