vi PROGRESS IN MICROSCOPY 



Chapter IV. Reflected-light Microscopy 



1. Methods applied in reflected-light microscopy 129 



2. Reflected-light phase-contrast. Jupnik, Osterberg and Pride phase micro- 

 scope. Fran9on, Nomarski, Bendford Seidenberg layouts 133 



3. Oblique illumination and dark ground in reflected light. Schmaltz's slit, 

 Menzel's method 136 



4. Reflected-light interference microscopes: Sagnac, Linnik-Zeiss. Krug 

 and Lau, Hilger and Watt, Baker, Mirau, Dyson, Fran^on, Nomarski. 

 Multi-wave layouts 142 



5. Observation in polarized light 158 



6. Scrutinizing of hot-metal surfaces 161 



Chapter V. Geometrical Measurements 



1. Settings in microscopy 163 



2. Setting accuracy 163 



3. Measuring a length in a focusing plane by means of two transverse settings 167 



4. Measuring a thin object by two axial settings 168 



5. Measuring a length whose ends do not lie in the same focusing plane 168 



6. Measuring small areas and volumes 169 



7. Determining the normal in a point of a small reflecting surface 169 



8. High precision-measurement microscopes 172 



Chapter VI. Measuring Refraction Indices of Transparent Objects: 

 Unpolarized Two-wave Interference Microscopes 



1. Measuring path differences 174 



2. Determining the refraction index from path difference measurement 179 



Chapter VII. Measuring Refraction Indices of Transparent Objects: 

 Polarizing Interference Microscopes 



Application of the full-duplication method 



1. Measuring path diff"erences by means of the flat-tints process (full-dupli- 

 cation process) 181 



2. Measuring path diff"erences, applying the fringes process (full-duplication 

 process) 187 



3. Determining the refraction index from path-diff"erence measurement 

 (full-duplication process) 195 



4. Measuring the refraction index of liquids (full-duplication process) 197 



Application of the diff'erential method 



5. Measuring path difference using the flat-tints method (differential process) 199 



6. Fringe-shift palh-difTercncc measurements (difTerential process) 203 



7. Determining the refraction index from path-difference measurements 205 



8. Measuring the refraction index of liquids (differential process) 206 



9. Measuring birefringence through a polarizing interference microscope 210 

 10. Conclusion 210 



Chapter VIII. Measuring Thickness and Slopes with Interference 

 Microscopes. Measuring Dry Masses 



1. Transparent objects 212 



2. Reflective objects (thickness measurement) 213 



