172 



PROGRESS IN MICROSCOPY 



8. HIGH PRECISION-MEASUREMENT MICROSCOPES 



The first microscope providing high-precision measurements were 

 developed by C. Cantu and A. Ranzini and constructed by Messrs, Ko- 

 ristka. This instrument, designed to investigate nuclear plates, is shown 

 in Fig. 5.9 (type MS2). The stage features two rectangular motions. 

 The X motion is obtained by means of a plate attachment so secured 

 as to virtually preclude any v motion (sag. = 0-3 /^ for a 50 mm travel). 



■T 





Fig. 5.9. Koristka high precision-measurement microscope. 



The y motion is conventional ("vee"-ways). Shifting the objective 

 provides the r motion which is obtained by a plate attachment and 

 hydraulic drive. Prior to effecting measurements in order to determine 

 the correction required, the .t, r and r motions are tested by means 

 of an interferometer. 



The type MS2 was followed by the type R4, designed from in- 

 vestigating large plates, measuring 300 by 300 millimetres; the R4-type 

 is particularly suited to speedy observations. In both types, the system 

 used to carry out the transverse setting is ingenious: the eyepiece 

 reticle is fixed. The image is slightly shifted by a parallel-sided plate 



