290 INDEX 



Dark-ground in reflected light 136 



Dephasing object 64 



Depth of focus produced by chromatism 14 



Determination of eutectic point composition 281 



Determining the melting point 271 



Determining the refraction index from path-difference measurement 179, 205 



Determining the refraction index from path-difference measurement (Full-duplication 



process) 1 95 

 Diagram (binary mixtures) 279 

 Diagram (temperature-composition) 276 

 DifiFerential method (interference microscopy) 107 

 Diffracted light in the focal plane of a microscope objective 57 

 Diffraction by parallel slits 44 

 Diffraction fringes surrounding a focal line 23 

 Diffraction pattern 3 



Diffraction pattern (apochromatic, fluorite and achromatic objective) 18 

 Diffraction pattern in presence of coma 22 

 Diffraction pattern (isophotes) 13 



Diffraction pattern (isophotes in presence of spherical aberration) 20 

 Diffraction pattern (isophotes when spherical aberration coma and astigmatism are 



present) 24 

 Diffraction patterns of various numerical apertures 7 

 Diffraction patterns when focusing is altered 12 

 Diffraction pattern with a reflecting objective 9 

 Double beam arrangement with photo-cell 248 

 Double beam microspectrophometric device 244 

 Dry masses (measurement) 226 

 Duplicated waves 106 



Dysons's interference microscope (transmitted light) 97 

 Dyson interference microscope (reflected light) 147 

 Dyson long working distance attachment 161 

 Edge of area (coherent and partially coherent illumination) 43 

 Effect of the condenser aperture on the resolution of a periodic object 55 

 Effect of the condenser aperture on the resolution of two pin-points 55 

 Errors in microspectrophotometry 258 

 Eutectic composition (Kofler method) 280 

 Eutectic (index measurement) 209 

 Extended object (coherent illumination) 40 

 Extended objects (incoherent illumination) 31 

 Eyepiece with illuminated reticle 170 

 Field curvature 22 

 Fluorescence 239 



Fluorescence spectrophotometry 263 

 Foster device 160 

 Foucault test 37 

 Francon's compensated interference eyepiece 113 



Half-sphere (phase contrast) 87 



Interference microscope (axial duplication method) 121 



Interference microscope (reflected light) 148 



