INDEX 291 



Francon and Nomarski phase contrast device (reflected light) 135 



Francon-Nomarski phase contrast device (transmitted light) 84 



Fringe-shift path-difference measurements (differential process) 203 



Fusible compounds (characterizing and identifying) 284 



Geometrical measurements 163 



Gibson and Tyndall curve 15 



Grain of photographic images 61 



Grey and Lee reflecting objective 233 



Half-plane object 37 



Hartley phase-plate 83 



Heine's condenser 80 



Heine phase contrast microscope 8i 



High precision-measurement microscopes 172 



Hilger and Watt interference microscope 154 



Hot-metal surfaces 161 



Hot stage 267 



Illuminated half-plane object 36 



Illumination of objects 24 



Image contrast 33 



Image contrast (effect of chromatism) 58 



Image contrast in phase microscopy 71 



Image converter 236 



Image duplication in a polarization interferometer 104 



Image formation (extended object) 31 



Image formation (incoherent extended object) 32 



Image of a luminous point in monochromatic light 2 



Image of a luminous point in white light 14 



Image of a luminous point originated by a reflecting objective 8 



Image of a luminous point when the microscope is not properly focused 9 



Image of a periodic object in coherent illumination 44 



Image of a small black disk (coherent illumination) 33 



Image of a small white disk 34 



Image of bright small disk (black ground) 42 



Image of thin black line (coherent or partially coherent illumination) 42 



Image of thin black line (coherent illumination) 43 



Image structure in phase-contrast 73 



Incoherent light 27 



Index measurement of a melted eutectic 209 



Infra-red microscopy 228 



Infra-red phase contrast 89 



Interference eyepiece 115 



Interference microscope applied to micro-hardness tests 154 



Interference microscope (measurement accuracy) 218 



Interference microscope (principals) 95 



Interference microscope (sensitivity) 128 



Interference microscopy (axial image duplication method) 109 



Interference microscopy (complete image duplication) 105 



Interference microscopy (differential method) 107 



