292 INDEX 



Interference microscopy (transmitted light) 94 



Jamin interferometer 103 



Johansson's interferometer eyepiece 117 



Johnson reflecting objective 232 



Jupnik, Osterberg and Pride phase microscope 134 



Kastler and Montarnal phase-plate 82 



Kofler contact method 274 



Kofler hot stage 268 



Kofler method for determination of eutectic composition 280 



Kohler illumination 28 



Kohler illumination in reflected light 130 



Koristka high precision-measurement microscope 172 



Krug and Lau interference microscope 146 



Lateral setting 164 



Lebedeff interference microscope 104 



Leitz's interference microscope 101 



Leitz's microscope-photometer 261 



Leitz's ultropak 141 



Lieberkuhn device 140 



Light distribution in the Foucault test 37 



Linnik's interference microscope 143 



Locquins's phase-plate 84 



Long v^orking distance attachment (Dyson) 161 



Luminous point in the presence of aberrations 19 



Luminous points on black ground (coherent illumination) 54 



Luminous points on black ground (incoherent illumination) 53 



Maksutov reflecting objective 232 



Maksutov solid reflecting objective 234 



Measurement accuracy with an interference microscope 218 



Measurements (microspectrophotometry) 255 



Measurements with interference fringes 125 



Measuring a length by means of lateral and axial settings 168 



Measuring a length by means of two lateral settings 167 



Measuring a thin object by 2 axial settings 168 



Measuring angles of contact between liquid and solid surfaces 222 



Measuring birefringence through a polarizing interference microscope 210 



Measuring dry masses by means of an interference microscope 226 



Measuring path differences 174 



Measuring path differences, applying the fringes process (full-duplication process) 187 



Measuring path differences by means of the flat-tints process (full-duplication process) 1 8 1 



Measuring path difference using the flat-tints method (differential process) 199 



Measuring refraction indices of transparent objects polarizing interference micro- 

 scopes 181 



Measuring refraction indices of transparent objects (unpolarized two-waves inter- 

 ference microscopes) 174 

 Measuring slopes with interference microscope 212 

 Measuring small areas and volumes 169 

 Measuring the refraction index of a melted substance 273 



