294 INDEX 



Periodic object in oblique illumination 48 



Phase-contrast applications 90 



Phase contrast (image-contrast) 71 



Phase contrast (image structure) 73 



Phase contrast (infra-rouge) 89 



Phase contrast microscope 77 



Phase contrast microscopy 64 



Phase contrast (reflected light) 133 



Phase contrast (sensitivity) 71 



Phase contrast (ultra-violet) 89 



Phase plate 69 



Photometric device using a plastic-material rod 263 



Photometric eyepieces 260 



Polanret microscope 82 



Polarization interference microscope 103 



Polarized light (by reflection) 158 



Range of coherence 27 



Range of coherence with an extended source 27 



Rayleigh's law 20 



Recording infra-red imagery 236 



Recording ultra-violet imagery 236 



Reflectance of a surface 60 



Reflected-light microscopy 129 



Reflected-light phase-contrast 133 



Reflecting objectives 228 



Refraction index (liquids) 197-206 



Refraction index (measurement of a melted substance) 273 



Refraction indices (determining from path difference measurement) 179 



Refraction indices (measurement with polarizing interferences microscope) 181 



Refraction indices (measurement with unpolarized two-waves interference microscope) 144 



Reichert's anoptral device 79 



Reichert's device (Epilum) 141 



Reichert hot stage microscope 269 



Replica method 157 



Resolving power 48 



Resolving power (elTects of stray light) 75 



Resolving power (incoherent illumination) 49 



Resolving power of a perfect instrument (numerical values) 58 



Sagnac's interference microscope 142 



Savart plate 1 14 



Schmaltz's slit 136 



Schmaltz's slit (improved method) 138 



Scharzschild-type reflecting objective 229 



Sensitivity of interference microscopes 128 



Sensitivity of phase contrast method 71 



Setting accuracy 163 



Setting in microscopy 163 



Slopes (measurement) 212 



