Symposium on X-Ray Microscopy and Microradio^^raphy, Cambridge 



45 



made at this first symposium. There is no danger of 

 an "X-Ray Microscope Society" being formed as it 

 was felt that the subject belonged to a broader held 

 of general micro investigation. However, another 

 meeting has tentatively been set for the summer of 

 1959, in Stockholm, at the invitation of Prof. Eng- 

 strom. The three methods were characterized by (I) 

 low voltages for contact microradiography, (2) new 

 interest in reflection x-ray microscopy outside of 

 Stanford, and (3) the extension of projection x-ray 

 microscopy to other methods such as microdifTrac- 

 tion, scanning, and absorption and fluorescence an- 

 alysis. 



At present, x-ray microscopy is just emerging 

 from the "grid and fly" stage and yet resolutions 

 down to 0.1 // are shown. By 1959 there will undoubt- 

 edly be improvements and the general feeling at 



this symposium would lead to an expectation of 

 reflection x-ray microscopy resolution better than 

 1000 A, projection x-ray microscopy much better 

 than 1000 A, vast amounts of contact microradio- 

 graphic results from commercial models, some re- 

 sults from projection x-ray microscope commercial 

 models, and an extension of quantitative microan- 

 alysis by all methods. 



Summaries of this Symposium on X-Ray Micro- 

 scopy and Microradiography have appeared in Na- 

 tiirc by Dr. Cosslett (1) and in Science by Prof. 

 Kirkpatrick, and the full volume of Proceedings 

 will be published in 1957 by the Academic Press, 

 New York. 



Reference 



1. Cosslett, V. E., Nature, 178, 676 (1956). 



