278 BELL SYSTEM TECHNICAL JOURNAL 



having the same shape as any two corresponding equipotential sur- 

 faces of the electrostatic system can be determined. 



The flux density at any points on the conductors or on the shield is 

 proportional to the rate of change of the potential with respect to the 

 normal to the surface at that point. The high-frequency resistances 

 of the conductors and shield, respectively, are proportional to the 



Fig. IS — Equipotential lines around shielded charged filaments. 



integral of the square of the flux density around their periphery. 

 Thus the high-frequency resistance of the circuit may be determined, 

 and from this and the capacitance, the high-frequency attenuation. 



This method makes it possible to determine and compare the high- 

 frequency attenuations of conductors having shapes corresponding to 

 the equipotential surfaces for various assumed arrangements and 

 numbers of charged filaments. If, however, the problem be that of 



