TKCIIMCAL rAl'KHS 1190 



MORIN, F. J.' 



Electrical Properties of of-Fe.O;; , Phys. Rev., 93, i)p. 1195-1199, 

 .Mar. 15, 1954. 



Pkarson, G. L., see Ciiapix, D. ^F. 



Pkarson, G. L., see Fletcher, R. C. 



Pfaxx, W. G., see Tanenbaum, M. 



Prince, M. B.^ 



Drift Mobilities in Semiconductors: II — Silicon, Phys. llcw, 93, 

 pp. 1204-1200, Mar. 15, 1954. 



QuATE, C. F., see Mendel, J. T. 



Pvead, W. T., see Fletcher, R. C. 



Shockey, W.,^ and Mason, W. P.^ 



Dissected Amplifiers Using Negative Resistance, Letter to the Editor, 



J. Appl. Phys., 25, No. 5, p. 077, i\Iay, 1954. 



Slepl\n, David^ 



Estimation of Signal Parameters in the Presence of Noise, I.R.E. 

 Trans. P.G.I .T.-3, pp. 08-89, Alar. 1954. 



Stansel, F. R} 



An Improved Method of Measuring the Current Amplification Factor 

 of Junction Transistors, I.R.E. Trans. PGl-3, pp. 41-49, April, 1954. 



Struthers, J. D., see Fuller, C. S. 



Tanenbaum, ]\I.,^ Gross, A. J.,^ and Pfann, W. G.^ 



Purification of Antimony and Tin by a New Method of Zone Re- 

 fining, J. Metals, 6, No. 6, pp. 762-703, June, 1954. 



Thomas, D. E.^ 



1 Bell Telephone Laboratories, Inc. 



