Abstracts of Technical Articles by Bell System Authors 



Administration of a Sampling Inspection Plan} H. V. Dodge. Greatly 

 expanded production during the war brought about extensive use of scien- 

 tific sampling plans both within manufacturing plants and by procurement 

 agencies. Perhaps most widely used were standard plans involvmg single 

 sampling, double sampling, and multiple sampling for visual and gaging 

 inspections on a go no-go basis. This paper discusses how a manufacturer 

 may make use of these samplmg plans in a manufacturing plant, how he 

 goes about deciding on suitable levels of quality expressed in per cent defec- 

 tive, how he determnes whether sampling can be used advantageously in 

 place of 100% inspection, and how he can choose and administer sampling 

 plans that will limit the risks of sampling as well as provide the desired 

 protection with a minimum amount of inspection. Particular attention 

 is given to the operating characteristics and the mode of application of the 

 standard AOQL (average outgoing quality limit) sampling plans published 

 by Dodge and Romig. 



The Bridge Erosion of Electrical Contacts. Part /.- J. J. Lander and L. 

 H. Germer. Bridge erosion is the transfer of metal from one electrode to 

 the others, which occurs when an electric current is broken in a low voltage 

 circuit which is essentially purely resistive. It is associated with the bridge 

 of molten metal formed between the electrodes as they are pulled apart, and 

 more specifically with the ultimate boiling of some of the metal of this 

 bridge before the contact is finally broken. This paper is concerned with 

 fundamental studies of this molten bridge and with empirical measurements 

 of the transfer of metal. 



Electron Bombardment Conductivity in Diamond? Kenneth G. McK.a.y. 

 A study has been made of electron bombardment conductivity in diamond 

 using primary electrons of energies up to 14,000 ev. An alternating field 

 method is used which reduces or eliminates the effects of internal space 

 charge fields. Data on internal yields as a function of crystal field are 

 given for both electron and positive hole carriers. Internal yields as high 

 as 600 have been attained. The experimental curves are fitted to a theoret- 

 ical curve for the space charge free crystal from which are derived reason- 

 able values for the number of electrons produced in the conduction band 

 per incident primary electron, the probable life time of the conduction 



1 Industrial Quality Control, November 1948. 

 ^Jour. Applied Physics, October 1948. 

 ^Phys. Rev., December 1, 1948. 



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