524 THE BELL SYSTEM TECHNICAL JOURNAL, MARCH 1956 



Moll, J. L.^ 



Junction Transistor Electronics, Proc. I.R.E., 43, pp. 1807-1818, 

 Dec, 1955. J 



MuMFORD, W. W.,^ and Schafersman^, R. L.^ ^ 



Data on Temperature Dependence of X-Band Fluorescent Lamp Noise 

 Sources, I.R.E. Trans., PGI-4, pp. 40-46, Oct., 1955. 



Neilson, G. C.,^ and James, D. B.^ 



Time of Flight Spectrometer for Fast Neutrons, Rev. Sci. Instr., 26, 

 pp. 1018-1023, Nov., 1955. 



Nesbitt, E. A.,^ and Williams, H. J.^ 



New Facts Concerning the Permanent Magnet Alloy, Alnico 5, Conf . 

 on Magnetism and Magnetic Materials, T-78, pp. 205-209, Oct., 1955. 



Nesbitt, E. A.,^ and Williams, H. J.^ 



Shape and Crystal Anisotropy of Alnico 5, J. Appl. Phys., 26, pp. 

 1217-1221, Oct., 1955. 



OWNES, C. D.i 



Stability of Molybdenum Permalloy Powder Cores, Conf. on Mag- J 

 netism and Magnetic Materials, T-78, pp. 334-339, Oct., 1955. 



Pearson, G. L.,^ and Brattain, W. H.^ 



History of Semiconductor Research, Proc. I.R.E., 43, pp. 1794-1806, 

 Dec, 1955. 



Pederson, L.^ 



Aluminum Die Castings in Carrier Telephone Systems, Modern 

 Metals, 11, pp. 65, 68, 70, Sept., 1955. 



Prince, M. B.^ 



High-Freauency Silicon Aluminum Alloy Junction Diode, Trans. 

 I.R.E., ED-2, pp. 8-9, Oct., 1955. 



Remeika, J. P., see Anderson, J. R. 



RiORDAN, J., see Fagen, R. E. 



1. Bell Telephone Laboratories, Inc. 



6. University of British Columbia, Vancouver, Canada. 



