TECHNICAL PAPERS 525 



Saibel, E., see Jacobson, M. J. 

 ScHAFERSMAN, R. L., See Mumford, W. W. 

 Schechter, D., see Kohn, W. 



Schelkunoff, S. A.^ 



On Representation of Electromagnetic Fields in Cavities in Terms of 

 Natural Modes of Oscillation, J. Appl. Phys., 26, pp. 1231-1234, Oct., 

 1955. 



Schwartz, M., see Logan, R. A. 



Shulman, R. G.,1 Mays, J. M.,i and McCall, D. W.^ 



Nuclear Magnetic Resonance in Semiconductors: I — ^ Exchange 

 Broadening in InSb and GaSb, Phys, Rev., 100, pp. 692-699, Oct. 

 15, 1955. 



Slocum, A.,^ and Augustine, C. F.^ 



6-KMC Phase Measurement System For Traveling Wave Tube, 

 Trans. I.R.E., PGI-4, pp. 145-149, Oct., 1955. 



Thurmond, C. D., see Geller, S. 



Uhlir, a., Jr.^ 



Micromachining with Virtual Electrodes, Rev. Sci. Instr., 26, pp. 

 965-968, Oct., 1955. 



Ulrich, W., see Yokelson, B, J, 



Van Uitert, L. G.^ 



DC Resistivity in the Nickel and Nickel Zinc Ferrite System, J. Chem. 

 Phys., 23, pp. 1883-1887, Oct., 1955. 



Van Uitert, L. G.^ 



Low Magnetic Saturation Ferrites for Microwave Applications, J. 

 Appl. Phys., 26, pp. 1289-1290, Nov., 1955. 



Wannier, G. H.^ 



Possibility of a Zener Effect, Phys. Rev., Letter to the Editor, 100, 

 p. 1227, Nov., 15, 1955. 



1. Bell Telephone Laboratories, Inc. 



