AUTOMATIC TESTING IN TELEPHONE MANUFACTURE 



1145 



AT BALANCE: 



BX = CA 



A = I000^AT68°F 

 1000 



I ±.OI(TOL.%) 

 C = NOM.RES. OF X 



(2-^ TO 35K) 

 X= WINDING RES. 



TO CIRCUITS 

 FOR FOLLOWING 

 TESTS 



UNLOCK 



(B) 



Fig. 6 — Circuits used in Relay Coil Test Set. (a), resistance bridge, simpli- 

 fied schematic; (b) continuity, simplified schematic. 



