INDEX 



15 



Jordan, D. R. 

 electron tube 

 traveling wave 

 M17S9 1343 

 Junction 

 NP 1241-42 

 TIN 

 bias 



reversed 

 electrons and holes 1239-84 

 Junction Diode See Diode 

 Junction Silicon Diode jSee Diode 

 Junction Tetrode Transistor See 



Transistor 

 Junction Transistor See Transistor 



Kearney Works (Western Electric) 

 coil 

 relay 

 testing 

 automatic 1141-48 

 Kell}', John L., Jr. 



biographical material 986 

 Xew Interpretation of Information Rate 

 917-26 

 King, Archie P. 



biographical material 986, 1235 

 Observed 5-6mm Attenuation for the Cir- 

 cular Electric Wave in Small and 

 Medium-Sized Pipes 1115-28 

 Transmission Loss Due to Resonance of 

 Loosely-Coupled Modes in a Multi- 

 Mode System 899-906 

 Kingsbury, B. A. 

 phase, tables 



computation 749 

 Kleinman, David A. 

 biographical material 763 

 Forward Characteristic of the PIN 

 Diode 685-706 

 Kleinman, D. A. 

 rectifier 

 junction 

 p-n 

 silicon 



development 684 

 Kompfer, R. 

 biographical material 244 

 Coupled Helices 127-78 



Kosten, L. 



toll traffic study 



431 



Laboratories See Bell Telephone 



Laboratories 

 Laboratory Model Magnetic Drum Trans- 

 lator for Toll Switching Offices (F. J. 

 Buhrendorf, H. A. Henning, (). J. 

 Murphy) 707-45 

 Laico, Joseph P. 



biographical material 1465 

 Medium Power Traveling-Wave Tube 

 for 6000-Mc Radio Relay 1285 

 1346 

 Lamont, J. 

 testing 

 automatic 1154 

 Large-Signal Theory of Traveling-Wave 



Amplifiers (P. K. Tien) 349-74 

 Lattice 

 crystal 

 germanivmi 



zone leveling 638 

 perfection 

 zone leveling 649-55 

 Leagus, Miss D. C. 



amplifier, traveling wave 

 large signal theorj- 373 

 Lee, Charles A. 



biographical material 245 

 High-Frequency Diffused Base Ger- 

 manium Transistor 23-34 

 Lennon, Miss C. A. 



toll traffic study 506 

 Leveler See Zone Leveler 

 Life Expectancy 

 electron tube 

 traveling wave 

 M1789 1342-43 

 rectifier 

 junction 

 p-n 

 silicon 680-83 

 reliability studies 

 experiment time 

 reduction, by statistical tech- 

 niques 179-202 

 Line(s), transmission See Transmis- 

 sion Lines 



