INDEX 



23 



crystal 



germanium 333-47 

 silicon 333-47 

 semiconductors 333^7 

 Sharpless, William M. 



biographical material 1466 

 Wafer-Type Millimeter Wave Rectifiers 

 1385-1402 

 Shillington, Harry R. 

 Automatic Machine for Testing Capaci- 

 tors and Resistance-Capacitance Net- 

 uwrks 1179-98 

 biographical material 1236 

 Shockley, William illus ii 

 biographical material iv 

 Nobel Prize in Phj'sics, 1956 i-iv 

 Shoffstall, H. F. 

 Automatic Testing of Transmission and 

 Operational Functions of JnteroU 

 Trunks 927-54 

 biographical material 988 

 Signal 

 binary 



amplification 



transistorized 1059-84 

 regeneration 



transistorized 1059-84 

 Signaling Alphabet See Alphabet 

 Silicon 

 crystal, see Crystal 

 defects 

 interactions, chemical 535-636 

 Silicon Diode See Diode 

 Silicon N-P-N Transistor See Trans- 

 istor 

 Silicon Rectifier See Rectifier 

 Single Crystals of Exceptional Perfection 

 and Uniformity by Zone Leveling 

 (D. C. Bennett, B. Sawyer) 637-60 

 60-Foot Diameter Parabolic Antenna for 

 Propagation Studies (A. B. Craw- 

 ford, H. T. Friis, W. C. Jakes, Jr.) 

 1199-1208 

 Slepian, David 



biographical material 245 

 Class of Binary Signaling Alphabets 

 203-34 ' 

 Smith, K. D. 

 rectifier 

 junction 



p-n 

 silicon 

 development 684 

 Smith, S. V. 



testing machines 1198 

 Smits, Friedolf M. 

 biographical material 1236 

 Use of an Interference Microscope for 

 Measurement of Extremely Thin Sur- 

 face Layers 1209-21 

 Sobel, Milton 

 biographical material 246 

 Statistical Techniques for Reducing the 

 Experimental Time in Reliability 

 Studies 179-202 

 Solution See Aqueous Solutions 

 Speed See Operate Speed 

 Spent Beam See Electron Beam 

 Spurious Modes See Mode 

 Statistical Methods 

 reliability studies 

 experiment time, reduction 179-202 

 Statistical Techniques for Reducing the 

 Experiment Time in Reliability 

 Stiidies (M. Sobel) 179-202 

 Stepped Coupler See Coupler 

 Stiles, G. J. 

 electron tube 

 traveling wave 



power saturation 867 

 Storage Systems See Digital Systems 

 Summing Amplifier See Amplifier 

 Surface 

 semiconductor 

 layers 



measurement 1209-21 

 transistor 

 point-contact 

 treatments 

 effects 767-811 

 Surface Photo-Voltage See Photo- 

 Voltage 

 Swenson, R. C. 

 rectifier 

 junction 

 p-n 

 silicon 

 development 684 

 Swept Intrinsic Structure See Semj- 

 c9nductor(s) J structure 



