For the combination of the CARAMBA and SAMB techniques previously 

 described, only one elevation angle, for example 6 opt , can be used to determine 

 the optimum distribution A e (a ). At other beam-pointing angles, the azimuth 

 pattern will deteriorate from the optimum because of phase errors. The resultant 

 azimuth-pattern beamwidth will broaden, as shown in figures 54 through 61. Fig- 

 ure 62 is a plot of the half-power beamwidth vs elevation angle for various 6 opt . 

 By choosing 8 opt at values other than zero, the useful range of the configuration 

 can be extended, i.e., the azimuth beamwidth can be specified within chosen limits. 



Another factor contributing to the beam broadening in azimuth is the de- 

 crease in the effective aperture. For comparison to a planar array, one can show 

 that the effective horizontal aperture is Trp eff , where p eff = p cos6. Figure 62 



shows the beamwidths obtainable with 9 = 8 opt , i.e., the optimum beamwidths 

 possible using the assumed amplitude distribution. It is seen that the beamwidth 

 is indeed broadened by cos"'6 as a result of the decrease in effective aperture. 



49 



