Table A-1. Probe placement effects on measured wave 

 dimension. Test conditions: T = 2.32 

 seconds, d = 1.00 foot, E = 4.0 inches, 

 G = 25 feet.l 



Test situation 



Gage location 



W(6)/W 



a. 



2x2 H-pile, 



6 = 



0° 



Deep within channel 



1.26 



b. 



2x2 H-pile, 



B = 



0° 



Just within channel 



1.31 



c. 



2x2 H-pile, 



B = 



90° 



Deep within channel 



0.80 



d. 



2x2 H-pile, 



6 = 



90° 



Just within channel 



0.74 



e. 



Flat plate. 



3 = 



90° 



0.25 inch from plate 



1.03 



f. 



Flat plate. 



B = 



90° 



0.75 inch from plate 



1.04 



■^Measurements made using CERC wafer gage (c in Fig. A-2) 

 with resolution of 0.015 W. 



