Title
The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
By
Type
Book
Material
Published material
Publication info
1981
Notes
Typescript.
Thesis (Ph. D.) --University of Florida, 1981.
Vita.
Subjects
Crystals , Defects , Dissertations, Academic , Electron microscopy , Materials Science and Engineering , Materials Science and Engineering thesis Ph. D , Transmission electron microscopes , UF
Language
English
Identifiers
DOI:
https://doi.org/10.5962/bhl.title.42486
OCLC:
8482591