The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects

By

Sykes, Lawrence Joseph, 1955-

Type

Book

Material

Published material

Publication info

1981

Notes

Typescript.

Thesis (Ph. D.) --University of Florida, 1981.

Vita.

Subjects

Crystals , Defects , Dissertations, Academic , Electron microscopy , Materials Science and Engineering , Materials Science and Engineering thesis Ph. D , Transmission electron microscopes , UF

Language

English

Identifiers

DOI: https://doi.org/10.5962/bhl.title.42486
OCLC: 8482591